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Characterization and Properties of Titanium-Vanadium Oxide Thin Films Prepared by ArF Laser Ablation
Fajgar, Radek ; Kupčík, Jaroslav ; Šubrt, Jan ; Novotný, F.
Thin films od vanadium-titanium complex oxides were prepared by ArF excimer laser ablation of Tio2 and VO2 targets. The light grey films with thickness of 155 nm were grown on glass and Au substrates and characterized by microscopy, spectroscopy and diffraction techniques. The as-prepared films were nanocrystalline and heating at 450°C in vacuum led to formation of mixture of crystalline V0.95Ti0.05O and TiO nanoparticles. The film shown reversible thermochronic behaviour between 3.0 and 1.4 micrometers. The films, annealed in air oxidize and the colour of the film changes to light yellow. Electrical and optical properties of the films are demonstrated.

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